For high frequency operation, it is essential to model the conductor properties and dielectric loss to be able to predict the total loss at high frequencies. At high frequencies the assumption of a smooth conductor does not stand true as the the wire resistance increases even faster than the square root of frequency due to surface roughness. In this work, the conductor and dielectric characterization of high-temperature co-fired ceramic (HTCC) and low-temperature co-fired ceramic (LTCC) using the cavity resonator and the double width stripline method is done. The cavity resonator method is based on fitting simulations to measurements. The resonance frequencies for the designed cavity resonators are 2.83 GHz, 4.5 GHz, 5.65 GHz, 9.5 GHz, 15.1 GHz and 19 GHz. For the HTCC sample, the extracted dielectric constant and loss tangent varies between 9.2 and 9.35 & 5.9e-3 and 1.38e-3 respectively. The double width stripline method was used for the first time for extraction of the surface roughness correction factor based on measurements only. Its application to the LTCC sample predicted a smooth conductor profile.